基于Z语言的机器视觉事件检测、分析和分类算法

Sukhpal Singh, Inderveer Chana, M. Singh
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引用次数: 2

摘要

在各种机器学习(ML)应用领域中,一个常见的任务是观察定期收集的数据,以寻找“有趣的”事件。这项任务主要是侦察,但也包括从调查科学数据到观察意外发生的事件,从控制工程程序到注意人类行为的责任。我们将这一观察过程与对显著表现进行分类的确定称为事件检测、分析和分类。随着个人计算机(pc)的出现,人们为用计算机化的方式代替人工调查做了很多努力。然而,数据已逐渐变得困难,近年来所收集数据的大小已变得极其庞大。文本文档、JPEG图像、MP3、视频甚至关系数据现在都是定期收集的。本文提出了一种机器视觉事件检测、分析和分类算法。除非该算法被认为是一个重要的工具,否则无法达到所需的事件检测程度。最后,我们使用K-means算法对传入事件进行分类,并通过Z形式规范语言对该算法进行了验证。该算法已在Matlab中实现,并通过数据挖掘工具收集了结果。利用该算法,可以方便地对事件进行机器视觉检测、分析和分类。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Z language based an algorithm for event detection, analysis and classification in machine vision
A common task in various machine learning (ML) application areas involves observing regularly gathered data for `interesting' events. This mission is predominant in reconnaissance, but also in responsibilities fluctuating from the investigation of scientific data to the observing of unsurprisingly happening events, and from controlling engineering procedures to noticing human behavior. We will refer to this observing procedure with the determination of classifying remarkable manifestations, as event detection, analysis and classification. With the appearance of personal computers (PCs) a lot of efforts have been made to substitute manual investigation by a computerized manner. Data, nevertheless, have become gradually difficult, and the sizes of gathered data have become enormously bulky in latest years. Text documents, JPEG images, MP3, videos and even relational data are now regularly gathered. In this paper, we propose an algorithm for event detection, analysis and classification in machine vision. Till proposed algorithm is deliberated a significant facility, required degree of event detection cannot be achieved. Finally, we use K-means algorithm for classification of incoming events and proposed algorithm has been validated by Z Formal specification language in general. The proposed algorithm has been implemented in Matlab and results have been gathered through a data mining tool. Using the proposed algorithm, the events are easily detected, analyzed and classified in machine vision.
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