{"title":"实验室x射线散射技术仪器","authors":"A. Kern","doi":"10.1107/97809553602060000936","DOIUrl":null,"url":null,"abstract":"Today's home-laboratory X-ray diffractometers can be used for a wide range of applications, from X-ray scattering from any solids or liquids with any degree of order to X-ray absorption (radiography) and X-ray emission (XRF) techniques. This chapter gives an overview of commonly used instrumentation, with the focus on X-ray scattering analyses. Instruments and beam-path components are described in their diversity, but the discussion is limited to recent designs.","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Instrumentation for laboratory X-ray scattering techniques\",\"authors\":\"A. Kern\",\"doi\":\"10.1107/97809553602060000936\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Today's home-laboratory X-ray diffractometers can be used for a wide range of applications, from X-ray scattering from any solids or liquids with any degree of order to X-ray absorption (radiography) and X-ray emission (XRF) techniques. This chapter gives an overview of commonly used instrumentation, with the focus on X-ray scattering analyses. Instruments and beam-path components are described in their diversity, but the discussion is limited to recent designs.\",\"PeriodicalId\":338076,\"journal\":{\"name\":\"International Tables for Crystallography\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Tables for Crystallography\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1107/97809553602060000936\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Tables for Crystallography","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1107/97809553602060000936","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Instrumentation for laboratory X-ray scattering techniques
Today's home-laboratory X-ray diffractometers can be used for a wide range of applications, from X-ray scattering from any solids or liquids with any degree of order to X-ray absorption (radiography) and X-ray emission (XRF) techniques. This chapter gives an overview of commonly used instrumentation, with the focus on X-ray scattering analyses. Instruments and beam-path components are described in their diversity, but the discussion is limited to recent designs.
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