{"title":"激光熔化半导体产生的时间分辨三次谐波","authors":"W. Grigsby, M. Downer, T. Ditmire","doi":"10.1109/CLEO.2007.4453635","DOIUrl":null,"url":null,"abstract":"To develop shock melting diagnostics, we are studying laser melted semiconductors using nonlinear optical probes. We find a rapid response in THG from Si and GaAs, with both linearly and circularly polarized incident radiation.","PeriodicalId":152616,"journal":{"name":"2007 Quantum Electronics and Laser Science Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Time-resolved third harmonic generation from laser- melted semiconductors\",\"authors\":\"W. Grigsby, M. Downer, T. Ditmire\",\"doi\":\"10.1109/CLEO.2007.4453635\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To develop shock melting diagnostics, we are studying laser melted semiconductors using nonlinear optical probes. We find a rapid response in THG from Si and GaAs, with both linearly and circularly polarized incident radiation.\",\"PeriodicalId\":152616,\"journal\":{\"name\":\"2007 Quantum Electronics and Laser Science Conference\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Quantum Electronics and Laser Science Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CLEO.2007.4453635\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Quantum Electronics and Laser Science Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CLEO.2007.4453635","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Time-resolved third harmonic generation from laser- melted semiconductors
To develop shock melting diagnostics, we are studying laser melted semiconductors using nonlinear optical probes. We find a rapid response in THG from Si and GaAs, with both linearly and circularly polarized incident radiation.
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