Microfacet和Microflake理论统一的新进展

J. Dupuy, E. Heitz, Eugene d'Eon
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引用次数: 30

摘要

我们从线性输运理论的角度研究了微面和微片理论之间的联系。在此过程中,我们获得了额外的见解,发现了一些简化,并触及了重要的开放性问题,以及扩展表面和体积散射模型统一的可能路径。首先,我们引入了一种半无限均匀指数自由路径介质,它(a)产生与Smith微表面散射模型和Heitz等人最近引入的非均匀Smith介质完全相同的光传输,并且(b)允许我们以一种简单的方式重新推导所有Smith掩蔽和阴影函数。其次,我们详细研究了线性输运理论的哪些新方面使体积像粗糙表面一样起作用。我们表明,这主要是由于使用了非对称的正态分布,并探索了这种对称性的破坏如何影响微片体积内的光输运而不破坏全局互易性。最后,我们认为与非常粗糙的史密斯微表面相一致的表面轮廓具有几何上难以置信的形状。为了克服这一点,我们讨论了Smith理论在体积设置中的扩展,其中包括整个球体上的ndf,以便产生一个统一的反射模型,能够描述从光滑的平面镜子一直到具有低和高粗糙度的半无限各向同性散射介质之间的一切。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Additional Progress Towards the Unification of Microfacet and Microflake Theories
We study the links between microfacet and microflake theories from the perspective of linear transport theory. In doing so, we gain additional insights, find several simplifications and touch upon important open questions as well as possible paths forward in extending the unification of surface and volume scattering models. First, we introduce a semi-infinite homogeneous exponential-free-path medium that (a) produces exactly the same light transport as the Smith microsurface scattering model and the inhomogeneous Smith medium that was recently introduced by Heitz et al, and (b) allows us to rederive all the Smith masking and shadowing functions in a simple way. Second, we investigate in detail what new aspects of linear transport theory enable a volume to act like a rough surface. We show that this is mostly due to the use of non-symmetric distributions of normals and explore how the violation of this symmetry impacts light transport within the microflake volume without breaking global reciprocity. Finally, we argue that the surface profiles that would be consistent with very rough Smith microsurfaces have geometrically implausible shapes. To overcome this, we discuss an extension of Smith theory in the volume setting that includes NDFs on the entire sphere in order to produce a single unified reflectance model capable of describing everything from a smooth flat mirror all the way to a semi-infinite isotropically scattering medium with both low and high roughness regimes in between.
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