SoC HDL-code诊断方法

V. Hahanov, S. A. Zaychenko, V. Varchenko
{"title":"SoC HDL-code诊断方法","authors":"V. Hahanov, S. A. Zaychenko, V. Varchenko","doi":"10.1109/EWDTS.2014.7027112","DOIUrl":null,"url":null,"abstract":"This article describes technology for diagnosis SoC HDL-models, based on Code-Flow Transaction Graph. Diagnosis method is focused to decrease the time of fault detection and memory for storage of diagnosis matrix by means of forming ternary relations between test, monitor, and functional component. The following problems are solved: creation of digital system model in the form of transaction graph and multi-tree of fault detection tables, as well as ternary matrices for activating functional components of the selected set of monitors by using test patterns; development of a method for analysis the activation matrix to detect the faulty blocks with given depth and synthesis logic functions for subsequent embedded hardware fault diagnosis.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Method for diagnosing SoC HDL-code\",\"authors\":\"V. Hahanov, S. A. Zaychenko, V. Varchenko\",\"doi\":\"10.1109/EWDTS.2014.7027112\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article describes technology for diagnosis SoC HDL-models, based on Code-Flow Transaction Graph. Diagnosis method is focused to decrease the time of fault detection and memory for storage of diagnosis matrix by means of forming ternary relations between test, monitor, and functional component. The following problems are solved: creation of digital system model in the form of transaction graph and multi-tree of fault detection tables, as well as ternary matrices for activating functional components of the selected set of monitors by using test patterns; development of a method for analysis the activation matrix to detect the faulty blocks with given depth and synthesis logic functions for subsequent embedded hardware fault diagnosis.\",\"PeriodicalId\":272780,\"journal\":{\"name\":\"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EWDTS.2014.7027112\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2014.7027112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文介绍了基于代码流事务图的SoC hdl模型诊断技术。诊断方法的重点是通过在测试、监控和功能部件之间形成三元关系,减少故障检测的时间和存储诊断矩阵的内存。解决了以下问题:以事务图和故障检测表多树的形式建立数字系统模型,以及利用测试模式激活所选监视器组功能部件的三元矩阵;开发了一种分析激活矩阵的方法,以检测给定深度的故障块,并为后续嵌入式硬件故障诊断提供综合逻辑功能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Method for diagnosing SoC HDL-code
This article describes technology for diagnosis SoC HDL-models, based on Code-Flow Transaction Graph. Diagnosis method is focused to decrease the time of fault detection and memory for storage of diagnosis matrix by means of forming ternary relations between test, monitor, and functional component. The following problems are solved: creation of digital system model in the form of transaction graph and multi-tree of fault detection tables, as well as ternary matrices for activating functional components of the selected set of monitors by using test patterns; development of a method for analysis the activation matrix to detect the faulty blocks with given depth and synthesis logic functions for subsequent embedded hardware fault diagnosis.
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