{"title":"基于sram的2D-FFT容错FPGA设计","authors":"Ziyang Chen, Meng Zhang, Wenjun Han","doi":"10.1109/ICCS52645.2021.9697214","DOIUrl":null,"url":null,"abstract":"2-Dimensional fast Fourier transform (FFT) has been widely used in radar signal process. Due to the need for high performance, field programmable gate array (FPGA) is an ideal hardware device for this application. For space-borne radar platform such as synthetic aperture radar (SAR), single-event upsets (SEUs) can cause lots of soft errors in static random-access memory (SRAM) based FPGA. As to this, protecting the 2D-FFT implemented in FPGA from SEUs is very important. In this article, we analyze the critical weakness induced by SEUs in the 2D-FFT process, and then a 2D-FFT design with high SEU resilience is presented. The design utilizes the advantage of several anti-SEU methods. For butterfly control in FFT, partially triple modular redundancy (TMR) is used. For data buffers, error correction code (ECC) is applied to read and write operation. Furthermore, safe finite state machine (FSM) is adopted by important control registers. Fault injection results show that all these reinforcement technologies contribute to enhance the ability to mitigate the SEU effects.","PeriodicalId":163200,"journal":{"name":"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of SEU Tolerant 2D-FFT in SRAM-based FPGA\",\"authors\":\"Ziyang Chen, Meng Zhang, Wenjun Han\",\"doi\":\"10.1109/ICCS52645.2021.9697214\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"2-Dimensional fast Fourier transform (FFT) has been widely used in radar signal process. Due to the need for high performance, field programmable gate array (FPGA) is an ideal hardware device for this application. For space-borne radar platform such as synthetic aperture radar (SAR), single-event upsets (SEUs) can cause lots of soft errors in static random-access memory (SRAM) based FPGA. As to this, protecting the 2D-FFT implemented in FPGA from SEUs is very important. In this article, we analyze the critical weakness induced by SEUs in the 2D-FFT process, and then a 2D-FFT design with high SEU resilience is presented. The design utilizes the advantage of several anti-SEU methods. For butterfly control in FFT, partially triple modular redundancy (TMR) is used. For data buffers, error correction code (ECC) is applied to read and write operation. Furthermore, safe finite state machine (FSM) is adopted by important control registers. Fault injection results show that all these reinforcement technologies contribute to enhance the ability to mitigate the SEU effects.\",\"PeriodicalId\":163200,\"journal\":{\"name\":\"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCS52645.2021.9697214\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCS52645.2021.9697214","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
2-Dimensional fast Fourier transform (FFT) has been widely used in radar signal process. Due to the need for high performance, field programmable gate array (FPGA) is an ideal hardware device for this application. For space-borne radar platform such as synthetic aperture radar (SAR), single-event upsets (SEUs) can cause lots of soft errors in static random-access memory (SRAM) based FPGA. As to this, protecting the 2D-FFT implemented in FPGA from SEUs is very important. In this article, we analyze the critical weakness induced by SEUs in the 2D-FFT process, and then a 2D-FFT design with high SEU resilience is presented. The design utilizes the advantage of several anti-SEU methods. For butterfly control in FFT, partially triple modular redundancy (TMR) is used. For data buffers, error correction code (ECC) is applied to read and write operation. Furthermore, safe finite state machine (FSM) is adopted by important control registers. Fault injection results show that all these reinforcement technologies contribute to enhance the ability to mitigate the SEU effects.