Yi-Tsung Chang, Ching-Tsang Chang, Guan-Sian Li, T. Horng
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引用次数: 1
摘要
在电化学剥离石墨烯的实验中,改变插入电压1~3V,改变2.4g硫酸、0 ~5 mL 30% KOH和100 mL去离子水的电解质组成,找出它们与石墨烯缺陷的关系。拉曼光谱分析表明,使用较低的插入电压和1:2的OH-: H+比可以减少缺陷的数量。其缺陷率ID/IG为0.5。
Reducing electrochemical exfoliated graphene defects by changing the insert voltage and electrolyte composition
In the experiments of electrochemical exfoliated graphene, the insert voltage1~3V and electrolyte composition of 2.4g sulfuric acid, 0 ~5 mL of 30% KOH and 100 mL of deionized water should were changed to find their relationship with graphene defects. Analysis of Raman spectra illustrated that using a lower insert voltage and a OH-: H+ ratio for the electrolyte of 1:2 reduced the number of defects. Its defect ratio ID/IG was 0.5.