{"title":"基于介电多态反射计的110-170 GHz测量系统","authors":"I. M. Boese, R. Collier","doi":"10.1109/EUMA.1996.337701","DOIUrl":null,"url":null,"abstract":"The paper will describe a novel measurement system which is part of a research project on the design of M3ICs at 140 GHz. The intension is to characterise on-wafer devices within the waveguide band 110 - 170 GHz using a dielectric waveguide multistate reflectometer (DMR). Although a lot of work has been done in recent years on realising 6 port and then 4 port reflectometers they either were built for frequency ranges below 100 GHz or they were realised using metallic waveguide technology.","PeriodicalId":219101,"journal":{"name":"1996 26th European Microwave Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Novel measurement system within 110-170 GHz using a dielectric multistate refiectometer\",\"authors\":\"I. M. Boese, R. Collier\",\"doi\":\"10.1109/EUMA.1996.337701\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper will describe a novel measurement system which is part of a research project on the design of M3ICs at 140 GHz. The intension is to characterise on-wafer devices within the waveguide band 110 - 170 GHz using a dielectric waveguide multistate reflectometer (DMR). Although a lot of work has been done in recent years on realising 6 port and then 4 port reflectometers they either were built for frequency ranges below 100 GHz or they were realised using metallic waveguide technology.\",\"PeriodicalId\":219101,\"journal\":{\"name\":\"1996 26th European Microwave Conference\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 26th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1996.337701\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 26th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1996.337701","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Novel measurement system within 110-170 GHz using a dielectric multistate refiectometer
The paper will describe a novel measurement system which is part of a research project on the design of M3ICs at 140 GHz. The intension is to characterise on-wafer devices within the waveguide band 110 - 170 GHz using a dielectric waveguide multistate reflectometer (DMR). Although a lot of work has been done in recent years on realising 6 port and then 4 port reflectometers they either were built for frequency ranges below 100 GHz or they were realised using metallic waveguide technology.
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