{"title":"可伸缩且高效的集成测试架构","authors":"M. Portolan, Suresh Goyal, B. G. V. Treuren","doi":"10.1109/TEST.2009.5355811","DOIUrl":null,"url":null,"abstract":"This paper presents the Test Instruction Set Architecture (TISA), an invention that can enable scalable interactive testing to leverage the experience of embedded computing. This approach is applied to an 1149.1 system, obtaining a processor able to efficiently handle instrument-based operations.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"202 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Scalable and efficient integrated test architecture\",\"authors\":\"M. Portolan, Suresh Goyal, B. G. V. Treuren\",\"doi\":\"10.1109/TEST.2009.5355811\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the Test Instruction Set Architecture (TISA), an invention that can enable scalable interactive testing to leverage the experience of embedded computing. This approach is applied to an 1149.1 system, obtaining a processor able to efficiently handle instrument-based operations.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"202 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355811\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355811","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Scalable and efficient integrated test architecture
This paper presents the Test Instruction Set Architecture (TISA), an invention that can enable scalable interactive testing to leverage the experience of embedded computing. This approach is applied to an 1149.1 system, obtaining a processor able to efficiently handle instrument-based operations.
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