用于测量可见-近红外色散的白光光谱干涉仪

Y. Arosa, Carlos Damián Rodríguez Fernández, B. Algnamat, E. López-Lago, R. de la Fuente
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引用次数: 0

摘要

我们设计了一种光谱分辨干涉仪,用于测量透明样品在400 ~ 1550 nm宽光谱带内的折射率。测量装置由一个迈克尔逊干涉仪组成,该干涉仪的输出通过三个光纤光谱仪进行分析。第一种是自制的棱镜光谱仪,得到样品在400 ~ 1050 nm范围内产生的干涉图;第二种是自制的透射光栅光谱仪,用于测量950 ~ 1550nm近红外波段的干涉图;最后一个是商用的切尔尼-特纳光谱仪,用于对迈克尔逊反射镜之间的位移进行高精度测量,也使用白光干涉测量法。整个系统由一个发射光谱与黑体相似的白光光源照射。我们用固体和液体样品对仪器进行了测试,在将折射率拟合到柯西公式后,其精度达到了第四位小数
本文章由计算机程序翻译,如有差异,请以英文原文为准。
White light spectral interferometer for measuring dispersion in the visible-near infrared
We have designed a spectrally resolved interferometer to measure the refractive index of transparent samples over a wide spectral band from 400 to 1550 nm. The measuring device consists of a Michelson interferometer whose output is analyzed by means of three fiber spectrometers. The first one is a homemade prism spectrometer, which obtains the interferogram produced by the sample over 400 to 1050 nm; the second one is a homemade transmission grating spectrometer thought to measure the interferogram in the near infrared spectral band from 950 to 1550 nm; the last one is a commercial Czerny-Turner spectrometer used to make high precision measurements of the displacement between the Michelson mirrors also using white light interferometry. The whole system is illuminated by a white light source with an emission spectrum similar to black body. We have tested the instrument with solid and liquids samples achieving accuracy to the fourth decimal on the refractive index after fitting it to a Cauchy formula
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