{"title":"模型检验与人工智能-第六届国际研讨会,MoChArt 2010,亚特兰大,GA, USA, 2010年7月11日,修订版精选和特邀论文","authors":"R. V. D. Meyden, J. Smaus","doi":"10.1007/978-3-642-20674-0","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":165267,"journal":{"name":"Model Checking and Artificial Intelligence","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Model Checking and Artificial Intelligence - 6th International Workshop, MoChArt 2010, Atlanta, GA, USA, July 11, 2010, Revised Selected and Invited Papers\",\"authors\":\"R. V. D. Meyden, J. Smaus\",\"doi\":\"10.1007/978-3-642-20674-0\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":165267,\"journal\":{\"name\":\"Model Checking and Artificial Intelligence\",\"volume\":\"107 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Model Checking and Artificial Intelligence\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-642-20674-0\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Model Checking and Artificial Intelligence","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-642-20674-0","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Model Checking and Artificial Intelligence - 6th International Workshop, MoChArt 2010, Atlanta, GA, USA, July 11, 2010, Revised Selected and Invited Papers