一种新的功能测试数据压缩方法

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Pub Date : 2006-10-04 DOI:10.1109/DFT.2006.9

H. Hashempour, F. Lombardi

{"title":"一种新的功能测试数据压缩方法","authors":"H. Hashempour, F. Lombardi","doi":"10.1109/DFT.2006.9","DOIUrl":null,"url":null,"abstract":"This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits","PeriodicalId":113870,"journal":{"name":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Novel Methodology for Functional Test Data Compression\",\"authors\":\"H. Hashempour, F. Lombardi\",\"doi\":\"10.1109/DFT.2006.9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits\",\"PeriodicalId\":113870,\"journal\":{\"name\":\"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2006.9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2006.9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

提出了一种自动测试设备功能测试数据压缩的新方法。提出了一种实用的测试数据二维重排序技术，除测试向量重排序外，还应用了列重排序。提出了一种从二维有序数据中提取原始测试向量的方法。通过对ISCAS基准电路二维有序测试数据的熵优值图验证了该方法的优越性

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A Novel Methodology for Functional Test Data Compression

This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

自引率

0.00%

发文量