一种组合选择校准的片上测量电路

2006 IEEE International SOC Conference Pub Date : 2006-09-01 DOI:10.1109/SOCC.2006.283844

J. Maunu, J. Marku, M. Laiho, A. Paasio

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引用次数: 6

摘要

我们提出了一种芯片上的测量电路，通过当前和未来CMOS技术的组合选择来校准电流源。电路评估输出电流值，并选择一个电流，以确保99%的失配补偿精度和4西格玛良率。

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An On-Chip Measurement Circuit for Calibration by Combination Selection

We present an on-chip measurement circuit for current source calibration by combination selection in current and future CMOS technologies. The circuit evaluates the output current values and selects a current that ensures 99% mismatch compensation accuracy with 4 sigma yield.

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来源期刊

2006 IEEE International SOC Conference

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