{"title":"开发和测试微处理器系统的技术","authors":"C. Hudson","doi":"10.1049/sm.1985.0022","DOIUrl":null,"url":null,"abstract":"Testing microprocessor systems at the development stage can take up to a third of the total development time and yet techniques for testing may only be thought about once the design stage has been undertaken. A correct approach to testing can considerably reduce the time needed to take a prototype through to a working system, and this not only means that a product can be on the market faster, but the development costs can be considerably reduced. The paper looks at the techniques and requirements for testing microprocessor-based systems and suggests alternatives to expensive development systems.","PeriodicalId":246116,"journal":{"name":"Softw. Microsystems","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Techniques for developing and testing microprocessor systems\",\"authors\":\"C. Hudson\",\"doi\":\"10.1049/sm.1985.0022\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Testing microprocessor systems at the development stage can take up to a third of the total development time and yet techniques for testing may only be thought about once the design stage has been undertaken. A correct approach to testing can considerably reduce the time needed to take a prototype through to a working system, and this not only means that a product can be on the market faster, but the development costs can be considerably reduced. The paper looks at the techniques and requirements for testing microprocessor-based systems and suggests alternatives to expensive development systems.\",\"PeriodicalId\":246116,\"journal\":{\"name\":\"Softw. Microsystems\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Softw. Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1049/sm.1985.0022\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Softw. Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/sm.1985.0022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Techniques for developing and testing microprocessor systems
Testing microprocessor systems at the development stage can take up to a third of the total development time and yet techniques for testing may only be thought about once the design stage has been undertaken. A correct approach to testing can considerably reduce the time needed to take a prototype through to a working system, and this not only means that a product can be on the market faster, but the development costs can be considerably reduced. The paper looks at the techniques and requirements for testing microprocessor-based systems and suggests alternatives to expensive development systems.