集成诊断难题中的软件缺失部分

D.L. Nichols, P.M. Vicen, R.B. Marcum
{"title":"集成诊断难题中的软件缺失部分","authors":"D.L. Nichols, P.M. Vicen, R.B. Marcum","doi":"10.1109/NAECON.1991.165916","DOIUrl":null,"url":null,"abstract":"It is noted that the maturity of software technologies, as they relate to integrated diagnostics, lags greatly behind hardware integrated diagnostics technologies. The authors present a case for advancing these types of software technologies. Software integrated diagnostics (SID) is defined as the subset of integrated diagnostics that concerns itself with the detection and isolation of errors in the operation of embedded software. It is recognized that errors in the operation of software may be the result of a number of causes, including requirements and design deficiencies, coding errors, hardware failures, or transient system effects. Within this context, SID concerns itself with two areas, detecting problems that manifest themselves in the software and isolating the source of the problems. The need to combine software and hardware failure isolation elevates SID to a system level function. The authors discuss an approach to developing SID technologies.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Software-missing piece in the integrated diagnostics puzzle\",\"authors\":\"D.L. Nichols, P.M. Vicen, R.B. Marcum\",\"doi\":\"10.1109/NAECON.1991.165916\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is noted that the maturity of software technologies, as they relate to integrated diagnostics, lags greatly behind hardware integrated diagnostics technologies. The authors present a case for advancing these types of software technologies. Software integrated diagnostics (SID) is defined as the subset of integrated diagnostics that concerns itself with the detection and isolation of errors in the operation of embedded software. It is recognized that errors in the operation of software may be the result of a number of causes, including requirements and design deficiencies, coding errors, hardware failures, or transient system effects. Within this context, SID concerns itself with two areas, detecting problems that manifest themselves in the software and isolating the source of the problems. The need to combine software and hardware failure isolation elevates SID to a system level function. The authors discuss an approach to developing SID technologies.<<ETX>>\",\"PeriodicalId\":247766,\"journal\":{\"name\":\"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAECON.1991.165916\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.1991.165916","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

值得注意的是,与综合诊断相关的软件技术的成熟度远远落后于硬件综合诊断技术。作者提出了推进这些类型的软件技术的一个案例。软件集成诊断(SID)被定义为集成诊断的子集,它关注嵌入式软件操作中的错误检测和隔离。人们认识到,软件运行中的错误可能是由许多原因造成的,包括需求和设计缺陷、编码错误、硬件故障或瞬态系统影响。在此上下文中,SID关注两个方面:检测软件中出现的问题和隔离问题的来源。将软件和硬件故障隔离结合起来的需求将SID提升为系统级功能。作者讨论了一种开发SID技术的方法
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Software-missing piece in the integrated diagnostics puzzle
It is noted that the maturity of software technologies, as they relate to integrated diagnostics, lags greatly behind hardware integrated diagnostics technologies. The authors present a case for advancing these types of software technologies. Software integrated diagnostics (SID) is defined as the subset of integrated diagnostics that concerns itself with the detection and isolation of errors in the operation of embedded software. It is recognized that errors in the operation of software may be the result of a number of causes, including requirements and design deficiencies, coding errors, hardware failures, or transient system effects. Within this context, SID concerns itself with two areas, detecting problems that manifest themselves in the software and isolating the source of the problems. The need to combine software and hardware failure isolation elevates SID to a system level function. The authors discuss an approach to developing SID technologies.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信