{"title":"一种改进的光隔离极低频电场传感器","authors":"R. Spiegel, E. Cooper, E. Bronaugh, D. R. Kerns","doi":"10.1109/ISEMC.1979.7568855","DOIUrl":null,"url":null,"abstract":"The design, development, and construction details of a probe for measuring electric fields between 200 V/m and 200 kV/m with a nominal measurement error of one percent are described. The probe is comprised of two small hemispheres, less than four centimetres in radius, which are separated by a small insulated gap. The electronics are placed inside the sphere, and a fiber optic link carries the field strength information to the remote receiver/display unit.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"An Improved Optically Isolated ELF Electric Field Sensor\",\"authors\":\"R. Spiegel, E. Cooper, E. Bronaugh, D. R. Kerns\",\"doi\":\"10.1109/ISEMC.1979.7568855\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design, development, and construction details of a probe for measuring electric fields between 200 V/m and 200 kV/m with a nominal measurement error of one percent are described. The probe is comprised of two small hemispheres, less than four centimetres in radius, which are separated by a small insulated gap. The electronics are placed inside the sphere, and a fiber optic link carries the field strength information to the remote receiver/display unit.\",\"PeriodicalId\":283257,\"journal\":{\"name\":\"1979 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1979 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1979.7568855\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1979 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1979.7568855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Improved Optically Isolated ELF Electric Field Sensor
The design, development, and construction details of a probe for measuring electric fields between 200 V/m and 200 kV/m with a nominal measurement error of one percent are described. The probe is comprised of two small hemispheres, less than four centimetres in radius, which are separated by a small insulated gap. The electronics are placed inside the sphere, and a fiber optic link carries the field strength information to the remote receiver/display unit.