厚石墨烯转移和RIE蚀刻芯片冷却

Woongkyu Choi, Jinwoo Jeong, K. Chun, B. D. Lee
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引用次数: 0

摘要

采用化学气相沉积法(CVD)在镍基上生长出厚度约为500nm ~ 1μm的厚石墨烯,并通过热压脱模带(TRT)将其转移到硅片上。将厚石墨烯转移到硅片上,进行胶带剥离试验和拉曼光谱分析。在O2、Ar气体的作用下,用RIE法制备了厚石墨烯的图像化。在O2-70sccm、Ar-30sccm、腔压0.055 torr、射频功率150w的腐蚀条件下,厚石墨烯的腐蚀速率约为100nm/min。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thick graphene transfer and RIE etching for chip cooling
Thick graphene which was grown by Chemical Vapor Deposition(CVD) on Nickel substrate and had thickness range about 500nm ~ 1μm was transferred into Si wafer using Hot Pressing with Thermal Release Tape(TRT). After transferring thick graphene into Si wafer, Scotch tape peeling test and Raman spectrum analysis were conducted. Patterning of thick graphene was demonstrated by RIE process with O2, Ar gas. Thick graphene etch rate is about 100nm/min at a etching condition which is O2-70sccm, Ar-30sccm, chamber pressure-0.055Torr, RF power-150W.
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