计算机键盘的高加速寿命试验方法

Hongjie Duan, Zhitian Chen, Shengli Li, Hongbin Cui
{"title":"计算机键盘的高加速寿命试验方法","authors":"Hongjie Duan, Zhitian Chen, Shengli Li, Hongbin Cui","doi":"10.1109/ICRMS.2016.8050112","DOIUrl":null,"url":null,"abstract":"A new method of Highly Accelerated Stress Screen/Life Testing (HASS/HALT) for computer keyboards is introduced and compared with User Information Investigation (UII) from manufacturer, Accelerated Life Testing (ALT), and Normal Stress Reliability Testing (NSRT). The results of the above three lab testing processes all showed good accordance trends with the data from the UII. The failure mechanism shows that a silicone cushion component acts as the spring and the shock absorber when keys are pressed, and acts as a key role to the key function, also decides the life of the key. When the dynamic load of “knocks” (mechanically simulated key presses) increases, the key life decreases, with degradation or failure especially apparent of the silicone cushion. Once a cushion fails, the dynamic shocking forces greatly increase, and the key cap soon breaks. The cushion failure was not a exclusive failure mode observed in the UII, NSRT, ALT and HALT tests, but a crucial one in the Complete Failure Mode Set. The HASS/HALT tests were able to show some quality control features of keyboards within a very short period. The trends corresponded well with real-world failure rate reported by users, ALT and NSRT. This study aids the design of rapid reliability/life testing which is important for product development and efficient quality control. With the help of this method, long-term reliability certification testing can be reduced from months to days.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A highly accelerated life test method for computer keyboards\",\"authors\":\"Hongjie Duan, Zhitian Chen, Shengli Li, Hongbin Cui\",\"doi\":\"10.1109/ICRMS.2016.8050112\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new method of Highly Accelerated Stress Screen/Life Testing (HASS/HALT) for computer keyboards is introduced and compared with User Information Investigation (UII) from manufacturer, Accelerated Life Testing (ALT), and Normal Stress Reliability Testing (NSRT). The results of the above three lab testing processes all showed good accordance trends with the data from the UII. The failure mechanism shows that a silicone cushion component acts as the spring and the shock absorber when keys are pressed, and acts as a key role to the key function, also decides the life of the key. When the dynamic load of “knocks” (mechanically simulated key presses) increases, the key life decreases, with degradation or failure especially apparent of the silicone cushion. Once a cushion fails, the dynamic shocking forces greatly increase, and the key cap soon breaks. The cushion failure was not a exclusive failure mode observed in the UII, NSRT, ALT and HALT tests, but a crucial one in the Complete Failure Mode Set. The HASS/HALT tests were able to show some quality control features of keyboards within a very short period. The trends corresponded well with real-world failure rate reported by users, ALT and NSRT. This study aids the design of rapid reliability/life testing which is important for product development and efficient quality control. With the help of this method, long-term reliability certification testing can be reduced from months to days.\",\"PeriodicalId\":347031,\"journal\":{\"name\":\"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICRMS.2016.8050112\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRMS.2016.8050112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

介绍了一种计算机键盘高加速应力屏/寿命试验(HASS/HALT)新方法,并与厂商用户信息调查(UII)、加速寿命试验(ALT)和正常应力可靠性试验(NSRT)进行了比较。上述三个实验室检测过程的结果均与UII的数据显示出良好的一致趋势。其失效机理表明,硅胶垫部件在按键被按下时起到了弹簧和减震器的作用,对按键功能起到了关键作用,也决定了按键的寿命。当“敲击声”(机械模拟按键)的动载荷增加时,按键寿命减少,硅胶垫的退化或失效尤其明显。一旦缓冲失效,动态震撼力大大增加,键盖很快就会断裂。缓冲失效并不是在ii、NSRT、ALT和HALT试验中观察到的唯一失效模式,而是在完全失效模式集中至关重要的失效模式。HASS/HALT测试能够在很短的时间内显示键盘的一些质量控制特征。该趋势与用户、ALT和NSRT报告的真实故障率吻合良好。该研究有助于设计快速可靠性/寿命测试,这对产品开发和有效的质量控制至关重要。在这种方法的帮助下,长期可靠性认证测试可以从几个月减少到几天。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A highly accelerated life test method for computer keyboards
A new method of Highly Accelerated Stress Screen/Life Testing (HASS/HALT) for computer keyboards is introduced and compared with User Information Investigation (UII) from manufacturer, Accelerated Life Testing (ALT), and Normal Stress Reliability Testing (NSRT). The results of the above three lab testing processes all showed good accordance trends with the data from the UII. The failure mechanism shows that a silicone cushion component acts as the spring and the shock absorber when keys are pressed, and acts as a key role to the key function, also decides the life of the key. When the dynamic load of “knocks” (mechanically simulated key presses) increases, the key life decreases, with degradation or failure especially apparent of the silicone cushion. Once a cushion fails, the dynamic shocking forces greatly increase, and the key cap soon breaks. The cushion failure was not a exclusive failure mode observed in the UII, NSRT, ALT and HALT tests, but a crucial one in the Complete Failure Mode Set. The HASS/HALT tests were able to show some quality control features of keyboards within a very short period. The trends corresponded well with real-world failure rate reported by users, ALT and NSRT. This study aids the design of rapid reliability/life testing which is important for product development and efficient quality control. With the help of this method, long-term reliability certification testing can be reduced from months to days.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信