一种逻辑约束下拓扑一致性测试方法

Jianwu Zhang, Guoai Xu, Yixian Yang, Shize Guo
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引用次数: 1

摘要

CC (Common Criteria)仅提供评估信息安全产品或系统的标准。一致性测试是从统计的角度考虑的,而确定拓扑是否与标准一致取决于一致性测试。基于CC的拓扑一致性测试由于缺乏有效的方法而陷入困境。提出了一种拓扑一致性测试方法,并介绍了一种逻辑约束下拓扑一致性测试算法。在我们的方法中,拓扑由矩阵描述,逻辑约束使用二进制决策图(bdd)数据结构存储。实验结果表明,该方法对拓扑一致性测试是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A method for topology conformance tests under logical constraints
Common Criteria(CC) provides only the standard for evaluating information security product or system. Conformance test is considered from a statistical point of view, while the determination of whether the topology is consistent with the standard depends on a conformance test. CC based topology conformance test is in trouble without an effective method. In this paper, a method for topology conformance test was presented and an algorithm for topology conformance test under logical constraints was introduced. In our method, the topology is described by a matrix and the logical constraints are stored using Binary Decision Diagrams (BDDs) data structure. From the experimental results, we can see the method is efficient enough for topology conformance test.
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