用x射线吸收精细结构光谱研究薄膜和氯水溶液

Tao Liu, Xingyu Gao, A. Wee, Y. Ping, H. Moser
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引用次数: 2

摘要

探讨了利用XAFS在SSLS的x射线演示和显影光束线(XDD)上进行薄膜低能测量的能力和性能。XDD由太阳神2号存储环的两个超导偶极子之一提供同步辐射。利用通道切割的Si(111)单色器,光子能量可在2.5 keV到10 keV之间进行调节,在数keV的能量下,光子通量为109光子/秒。对XAFS所需的能量分辨率、探测器和控制系统进行了优化。为了证明这一点,我们测量并讨论了Mn掺杂ZnO薄膜在Mn- k边和Cl - k边的氯水溶液的XAFS光谱。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
STUDY OF THIN FILMS AND AQUEOUS CHLORINE SOLUTION USING X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY
The capability of thin film measurement and performance at low energy using XAFS at the X-ray demonstration and development beamline (XDD) at SSLS has been explored. XDD is supplied with synchrotron radiation from one of the two superconducting dipoles of the Helios 2 storage ring. The photon energy is tunable from 2.5 keV to 10 keV using a channel-cut Si(111) monochromator and the photon flux is of the order of 109 photons/s at energies of several keV. The energy resolution, detector, and control system required by XAFS were optimized. As a demonstration, the XAFS spectra of Mn-doped ZnO thin films at Mn K-edge and chlorine aqueous solution at Cl K-edge were measured and discussed.
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