基于EBSP的局部纹理测量。新电脑程序

Textures and Microstructures Pub Date : 1900-01-01 DOI:10.1155/TSM.14-18.97

D. Jensen, N. Schmidt

{"title":"基于EBSP的局部纹理测量。新电脑程序","authors":"D. Jensen, N. Schmidt","doi":"10.1155/TSM.14-18.97","DOIUrl":null,"url":null,"abstract":"Two new computer procedures for analysis of electron back scattering patterns \n(EBSP) are presented. One is a semiautomatic procedure for on-line analysis of EBSPs. \nThe other is an image processing procedure for computer identification of bands in an \nEBSP. These two procedures may be combined for fully automatic indexing of EBSPs.","PeriodicalId":129427,"journal":{"name":"Textures and Microstructures","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Local Texture Measurements by EBSP. New Computer Procedures\",\"authors\":\"D. Jensen, N. Schmidt\",\"doi\":\"10.1155/TSM.14-18.97\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two new computer procedures for analysis of electron back scattering patterns \\n(EBSP) are presented. One is a semiautomatic procedure for on-line analysis of EBSPs. \\nThe other is an image processing procedure for computer identification of bands in an \\nEBSP. These two procedures may be combined for fully automatic indexing of EBSPs.\",\"PeriodicalId\":129427,\"journal\":{\"name\":\"Textures and Microstructures\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Textures and Microstructures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1155/TSM.14-18.97\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Textures and Microstructures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/TSM.14-18.97","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 10

摘要

提出了两种新的电子背散射图(EBSP)计算机分析方法。一个是用于在线分析EBSPs的半自动程序。另一种是用于EBSP波段计算机识别的图像处理程序。这两个程序可以结合起来进行ebsp的全自动标引。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Local Texture Measurements by EBSP. New Computer Procedures

Two new computer procedures for analysis of electron back scattering patterns (EBSP) are presented. One is a semiautomatic procedure for on-line analysis of EBSPs. The other is an image processing procedure for computer identification of bands in an EBSP. These two procedures may be combined for fully automatic indexing of EBSPs.

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Textures and Microstructures

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