事件驱动电路仿真的可变精度器件建模

K. Michaels, A. Strojwas
{"title":"事件驱动电路仿真的可变精度器件建模","authors":"K. Michaels, A. Strojwas","doi":"10.1109/EDTC.1994.326819","DOIUrl":null,"url":null,"abstract":"This paper presents a complete variable accuracy device modeling methodology which varies the error tolerances and device model accuracy during the simulation based upon the dynamic state of operation of the circuit and the circuit topology. The number of device model evaluations required and the average device model evaluation time are minimized.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Variable accuracy device modeling for event-driven circuit simulation\",\"authors\":\"K. Michaels, A. Strojwas\",\"doi\":\"10.1109/EDTC.1994.326819\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a complete variable accuracy device modeling methodology which varies the error tolerances and device model accuracy during the simulation based upon the dynamic state of operation of the circuit and the circuit topology. The number of device model evaluations required and the average device model evaluation time are minimized.<<ETX>>\",\"PeriodicalId\":244297,\"journal\":{\"name\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1994.326819\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326819","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了一种完整的变精度器件建模方法,该方法根据电路的动态工作状态和电路拓扑结构,在仿真过程中改变误差容限和器件模型精度。设备模型评估所需的数量和平均设备模型评估时间被最小化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Variable accuracy device modeling for event-driven circuit simulation
This paper presents a complete variable accuracy device modeling methodology which varies the error tolerances and device model accuracy during the simulation based upon the dynamic state of operation of the circuit and the circuit topology. The number of device model evaluations required and the average device model evaluation time are minimized.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信