{"title":"专用于非共振近场微波显微镜的高阻抗反射计","authors":"D. Glay, A. El Fellahi, T. Lasri","doi":"10.23919/EUMC.2012.6459196","DOIUrl":null,"url":null,"abstract":"In this paper we present a novel method of near-field microwave microscopy using a high impedance measurement system. The proposed system combines a classical vector network analyzer to a high referenced impedance splitter via impedance matching networks. We show that the resulting high impedance reflectometer associated to a tip probe permits to compensate the limitation of the non-resonant mode by using the frequency diversity.","PeriodicalId":266910,"journal":{"name":"2012 42nd European Microwave Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"High impedance reflectometer dedicated to non-resonant near-field microwave microscopy\",\"authors\":\"D. Glay, A. El Fellahi, T. Lasri\",\"doi\":\"10.23919/EUMC.2012.6459196\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we present a novel method of near-field microwave microscopy using a high impedance measurement system. The proposed system combines a classical vector network analyzer to a high referenced impedance splitter via impedance matching networks. We show that the resulting high impedance reflectometer associated to a tip probe permits to compensate the limitation of the non-resonant mode by using the frequency diversity.\",\"PeriodicalId\":266910,\"journal\":{\"name\":\"2012 42nd European Microwave Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 42nd European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EUMC.2012.6459196\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 42nd European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EUMC.2012.6459196","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High impedance reflectometer dedicated to non-resonant near-field microwave microscopy
In this paper we present a novel method of near-field microwave microscopy using a high impedance measurement system. The proposed system combines a classical vector network analyzer to a high referenced impedance splitter via impedance matching networks. We show that the resulting high impedance reflectometer associated to a tip probe permits to compensate the limitation of the non-resonant mode by using the frequency diversity.
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