{"title":"电大型天线的球面近场测量","authors":"G. Cheng, Yong Zhu, J. Grzesik, C. S. Lee","doi":"10.1109/IWMN.2017.8078399","DOIUrl":null,"url":null,"abstract":"A new technique is presented for highly accurate far-field patterns obtained from spherical measurements in the near field of electrically large antennas. The proposed technique is based on the Field Mapping Algorithm, which provides exact fields on any desired surface from near-field data measured over a planar, cylindrical, or spherical surface. This method makes it possible to calculate complete far-field patterns, including especially the backlobes for large reflector antennas.","PeriodicalId":201479,"journal":{"name":"2017 IEEE International Workshop on Measurement and Networking (M&N)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spherical near-fîeld measurements for electrically large antennas\",\"authors\":\"G. Cheng, Yong Zhu, J. Grzesik, C. S. Lee\",\"doi\":\"10.1109/IWMN.2017.8078399\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new technique is presented for highly accurate far-field patterns obtained from spherical measurements in the near field of electrically large antennas. The proposed technique is based on the Field Mapping Algorithm, which provides exact fields on any desired surface from near-field data measured over a planar, cylindrical, or spherical surface. This method makes it possible to calculate complete far-field patterns, including especially the backlobes for large reflector antennas.\",\"PeriodicalId\":201479,\"journal\":{\"name\":\"2017 IEEE International Workshop on Measurement and Networking (M&N)\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Workshop on Measurement and Networking (M&N)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWMN.2017.8078399\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Workshop on Measurement and Networking (M&N)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWMN.2017.8078399","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Spherical near-fîeld measurements for electrically large antennas
A new technique is presented for highly accurate far-field patterns obtained from spherical measurements in the near field of electrically large antennas. The proposed technique is based on the Field Mapping Algorithm, which provides exact fields on any desired surface from near-field data measured over a planar, cylindrical, or spherical surface. This method makes it possible to calculate complete far-field patterns, including especially the backlobes for large reflector antennas.