Jit故障检测:实时提高102个系统的可用性

L. Botler, N. Kajtazovic, K. Diwold, K. Römer
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引用次数: 0

摘要

随着硅技术尺寸的减小,存储器更容易受到外部影响,这可能导致软错误。虽然是暂时的,但这些错误对安全关键系统构成了挑战。基于冗余的错误检测通常用于工业中,以提高安全性并减轻这些错误。当检测到错误时,对安全至关重要的系统通常会切换到安全状态。虽然这可以防止故障,但它会对系统的可用性产生负面影响。在这项工作中,我们提出了即时故障检测,这是一种新颖的方法,只有在检测到的错误会影响系统行为的情况下,系统才能切换到安全状态。实现了一个软件工具,可以在现成的处理器上部署该方法,并对该方法进行了验证,并与使用混合关键存储器的最先进的替代方法进行了比较。我们的结果表明,在执行两种不同的标准算法时,与最先进的方法相比,可用性增益在25.2%到100%之间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Jit fault detection: increasing availability in 1oo2 systems just-in-time
With silicon technology decreasing in size, memories get more susceptible to external influences, which can lead to soft errors. Although temporary, these errors constitute a challenge for safety-critical systems. Redundancy-based error detection is commonly used in industry to increase safety and mitigate these errors. When an error is detected, safety-critical systems are usually switched to a safe state. While this prevents failures, it negatively affects the system's availability. In this work, we propose Just-in-Time fault detection, a novel method which enables a system to be switched to the safe state only in case a detected error would affect the system's behavior. A software tool enabling the deployment of this method on an off-the-shelf processor is implemented, and the method is validated and compared with a state-of-the-art alternative approach using mixed-critical memories. Our results show an availability gain between 25.2% and 100% compared with the state-of-the-art approach while executing two different standard algorithms.
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