Junsik Park, Jingook Kim, Jong-Sung Lee, Byongsu Seol
{"title":"用PEEC方法有效计算导体环路上的ESD电感耦合","authors":"Junsik Park, Jingook Kim, Jong-Sung Lee, Byongsu Seol","doi":"10.1109/ISEMC.2014.6899034","DOIUrl":null,"url":null,"abstract":"The transient voltage waveforms coupled by ESD events are effectively calculated using the partial element equivalent circuit (PEEC) method. The PEEC method has several advantages in prediction of ESD transient waveforms. As a test, a victim structure has been designed for the inductive coupling to be dominant. The calculated waveforms are validated by comparison with measurements both in frequency and time domains.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Efficient calculation of ESD inductive coupling on a conductor loop using PEEC method\",\"authors\":\"Junsik Park, Jingook Kim, Jong-Sung Lee, Byongsu Seol\",\"doi\":\"10.1109/ISEMC.2014.6899034\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The transient voltage waveforms coupled by ESD events are effectively calculated using the partial element equivalent circuit (PEEC) method. The PEEC method has several advantages in prediction of ESD transient waveforms. As a test, a victim structure has been designed for the inductive coupling to be dominant. The calculated waveforms are validated by comparison with measurements both in frequency and time domains.\",\"PeriodicalId\":279929,\"journal\":{\"name\":\"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"108 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2014.6899034\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2014.6899034","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient calculation of ESD inductive coupling on a conductor loop using PEEC method
The transient voltage waveforms coupled by ESD events are effectively calculated using the partial element equivalent circuit (PEEC) method. The PEEC method has several advantages in prediction of ESD transient waveforms. As a test, a victim structure has been designed for the inductive coupling to be dominant. The calculated waveforms are validated by comparison with measurements both in frequency and time domains.