一种将I/O工作负载与功能覆盖相关联的新型协作SSD测试用例聚类方法

2022 IEEE European Test Symposium (ETS) Pub Date : 2022-05-23 DOI:10.1109/ETS54262.2022.9810424

Gyohun Jeong, Sangmin Kim, Hye-Rin Kim, S. Lee

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引用次数: 0

摘要

在本文中，我们提出了一种TC聚类方法，该方法同时考虑两个数据组:I/O工作负载和用于更高级别固件测试的功能覆盖。随后，我们引入一个应用程序模型，该模型仅使用上述方法中tc的I/O工作负载来预测功能覆盖率。

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A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage

In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.

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来源期刊

2022 IEEE European Test Symposium (ETS)

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