用于测量高功率o型器件中时间分辨电子束分布的诊断装置

Proceedings International University Conference 'Electronics and Radiophysics of Ultra-High Frequencies' (Cat. No.99EX356) Pub Date : 1999-05-24 DOI:10.1109/UHF.1999.787925

A. Arkhipov, N.V. Dvoretskaja, G. Sominski

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引用次数: 0

摘要

介绍了一种新型高功率微波o型器件电子束参数实验测定装置的特点。测量是在装置的集电极部分进行的，电子束在与射频结构相互作用后，在没有外部电场或磁场的情况下膨胀。分析部分代替集热器安装在微波管上，测量电子束的空间分布、角度分布和能量分布。

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A diagnostic setup for measurement of time-resolved electron beam distributions in high-power O-type devices

Characteristics of a new all-in-one setup for experimental determination of electron beam parameters of high-power microwave O-type devices are given. The measurements were made in the collector part of the device, where the electron beam expanded in the absence of external electric or magnetic fields after interaction with the rf structure. The analyzing section was mounted to the microwave tube instead of the collector unit to measure spatial, angular and energy distributions of the electron beam.

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Proceedings International University Conference 'Electronics and Radiophysics of Ultra-High Frequencies' (Cat. No.99EX356)

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