{"title":"混响室电磁兼容测试的新电场表达式","authors":"G. Koepke, J. Ladbury","doi":"10.1109/DASC.1998.741552","DOIUrl":null,"url":null,"abstract":"The statistical models used in reverberation chamber analysis have demonstrated good agreement with measured data from well-designed chambers. We use the models to derive several corrections to the field prediction formulas quoted in earlier publications. In this paper we will present a brief summary of these statistical models and the impact on earlier estimations of fields in the chamber. We will demonstrate how these statistical models are applied to actual measurements in reverberation chambers. This work has a direct impact on the estimate of chamber fields to which a device-under-test or vehicle is exposed during electromagnetic vulnerability tests.","PeriodicalId":335827,"journal":{"name":"17th DASC. AIAA/IEEE/SAE. Digital Avionics Systems Conference. Proceedings (Cat. No.98CH36267)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"New electric field expressions for EMC testing in a reverberation chamber\",\"authors\":\"G. Koepke, J. Ladbury\",\"doi\":\"10.1109/DASC.1998.741552\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The statistical models used in reverberation chamber analysis have demonstrated good agreement with measured data from well-designed chambers. We use the models to derive several corrections to the field prediction formulas quoted in earlier publications. In this paper we will present a brief summary of these statistical models and the impact on earlier estimations of fields in the chamber. We will demonstrate how these statistical models are applied to actual measurements in reverberation chambers. This work has a direct impact on the estimate of chamber fields to which a device-under-test or vehicle is exposed during electromagnetic vulnerability tests.\",\"PeriodicalId\":335827,\"journal\":{\"name\":\"17th DASC. AIAA/IEEE/SAE. Digital Avionics Systems Conference. Proceedings (Cat. No.98CH36267)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"17th DASC. AIAA/IEEE/SAE. Digital Avionics Systems Conference. Proceedings (Cat. No.98CH36267)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DASC.1998.741552\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"17th DASC. AIAA/IEEE/SAE. Digital Avionics Systems Conference. Proceedings (Cat. No.98CH36267)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DASC.1998.741552","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New electric field expressions for EMC testing in a reverberation chamber
The statistical models used in reverberation chamber analysis have demonstrated good agreement with measured data from well-designed chambers. We use the models to derive several corrections to the field prediction formulas quoted in earlier publications. In this paper we will present a brief summary of these statistical models and the impact on earlier estimations of fields in the chamber. We will demonstrate how these statistical models are applied to actual measurements in reverberation chambers. This work has a direct impact on the estimate of chamber fields to which a device-under-test or vehicle is exposed during electromagnetic vulnerability tests.