{"title":"CMOS图像传感器的二维MTF和串扰特性","authors":"R. Segal, I. Shcherback, O. Yadid-Pecht","doi":"10.1109/EEEI.2006.321101","DOIUrl":null,"url":null,"abstract":"This work describes a new approach to CMOS Image Sensors (CIS) characterization, based on the Submicron Scanning System (S-cube system). The S-cube system inherently enables two-dimensional responsivity map acquisition for CISs and provides a 2-D pixel Point Spread Function (PSF), 2-D pixel Modulation Transfer Function (MTF) and 2-D sensor crosstalk (CTK) measurements. The effectiveness and advantages of the proposed method are shown; enabling to determine both, the influence of each pixel-composing element on its overall signal, and sensor resolution abilities characterization for each wavelength of interest. The advantages and necessity of 2-D characterization for sensor performance understanding and improvement are clearly emphasized.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"147 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Two-Dimensional MTF and Crosstalk Characterization for CMOS Image Sensors\",\"authors\":\"R. Segal, I. Shcherback, O. Yadid-Pecht\",\"doi\":\"10.1109/EEEI.2006.321101\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work describes a new approach to CMOS Image Sensors (CIS) characterization, based on the Submicron Scanning System (S-cube system). The S-cube system inherently enables two-dimensional responsivity map acquisition for CISs and provides a 2-D pixel Point Spread Function (PSF), 2-D pixel Modulation Transfer Function (MTF) and 2-D sensor crosstalk (CTK) measurements. The effectiveness and advantages of the proposed method are shown; enabling to determine both, the influence of each pixel-composing element on its overall signal, and sensor resolution abilities characterization for each wavelength of interest. The advantages and necessity of 2-D characterization for sensor performance understanding and improvement are clearly emphasized.\",\"PeriodicalId\":142814,\"journal\":{\"name\":\"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel\",\"volume\":\"147 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EEEI.2006.321101\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEEI.2006.321101","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Two-Dimensional MTF and Crosstalk Characterization for CMOS Image Sensors
This work describes a new approach to CMOS Image Sensors (CIS) characterization, based on the Submicron Scanning System (S-cube system). The S-cube system inherently enables two-dimensional responsivity map acquisition for CISs and provides a 2-D pixel Point Spread Function (PSF), 2-D pixel Modulation Transfer Function (MTF) and 2-D sensor crosstalk (CTK) measurements. The effectiveness and advantages of the proposed method are shown; enabling to determine both, the influence of each pixel-composing element on its overall signal, and sensor resolution abilities characterization for each wavelength of interest. The advantages and necessity of 2-D characterization for sensor performance understanding and improvement are clearly emphasized.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
