Xin Wang, Lin Lin, He Tang, Jian Liu, Q. Fang, H Zhao, Albert Z. H. Wang, S. Fan, X. Guan, B. Zhao, Zitao Shi, Yuhua Cheng, B. Qin, Liwu Yang
{"title":"UWB SoC与ESD保护协同设计","authors":"Xin Wang, Lin Lin, He Tang, Jian Liu, Q. Fang, H Zhao, Albert Z. H. Wang, S. Fan, X. Guan, B. Zhao, Zitao Shi, Yuhua Cheng, B. Qin, Liwu Yang","doi":"10.1109/SOCDC.2010.5682986","DOIUrl":null,"url":null,"abstract":"This paper discusses critical aspects for co-design of ultra wideband (UWB) system-on-chip (SoC) and on-chip electrostatic discharge (ESD) protection, which are beyond simple data rate and bandwidth considerations. UWB-ESD co-design techniques and experiment results are presented. The designs were implemented in a commercial 0.18μm RFCMOS.","PeriodicalId":380183,"journal":{"name":"2010 International SoC Design Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"UWB SoC co-design with ESD protection\",\"authors\":\"Xin Wang, Lin Lin, He Tang, Jian Liu, Q. Fang, H Zhao, Albert Z. H. Wang, S. Fan, X. Guan, B. Zhao, Zitao Shi, Yuhua Cheng, B. Qin, Liwu Yang\",\"doi\":\"10.1109/SOCDC.2010.5682986\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses critical aspects for co-design of ultra wideband (UWB) system-on-chip (SoC) and on-chip electrostatic discharge (ESD) protection, which are beyond simple data rate and bandwidth considerations. UWB-ESD co-design techniques and experiment results are presented. The designs were implemented in a commercial 0.18μm RFCMOS.\",\"PeriodicalId\":380183,\"journal\":{\"name\":\"2010 International SoC Design Conference\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International SoC Design Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOCDC.2010.5682986\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International SoC Design Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCDC.2010.5682986","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper discusses critical aspects for co-design of ultra wideband (UWB) system-on-chip (SoC) and on-chip electrostatic discharge (ESD) protection, which are beyond simple data rate and bandwidth considerations. UWB-ESD co-design techniques and experiment results are presented. The designs were implemented in a commercial 0.18μm RFCMOS.