用分流电弧放电法制备含氮碳等离子体制备氮化碳薄膜

K. Takaki, K. Iinanishi, S. Mukaigawa, T. Fujiwara, Y. Suda, K. Yukimura
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引用次数: 4

摘要

只提供摘要形式。等离子体离子注入与沉积(PBII&D)技术是一种很有前途的方法,可以改善三维基底作为工件的表面性能,而无需复杂的操作系统。分流电弧是一种方便的脉冲等离子体源的金属和半金属。本研究在氮气环境下产生碳分流电弧放电,并利用等离子体制备了非晶氮化碳(a- cnx)薄膜。在实验中,采用自磁加速系统来提高沉积速率。直径为2毫米,长度为40毫米的碳棒垂直地夹在一对碳电极之间。20 muf电容器组用于点燃并联电弧。将碳膜制备在直径为80mm、厚度为10mm的圆盘靶上,作为弧源放置在距杆100mm处。将硅衬底粘贴在盘靶上,在硅衬底上施加一系列脉冲电压,同时点燃峰值电流为1.7 kA的并联电弧。环境氮气压力从2倍10-2到300 Pa不等。成功地产生了分流电弧等离子体,并沿碳轨加速。产生并联电弧的加热能量随气体压力的变化有最小值。等离子体的光谱测量表明,在氮气环境下产生的等离子体含有氮粒子。x射线光电子能谱分析表明,注入氮气后,C (1s)峰的结合能由C-C的结合能BE转变为sp2C-N和sp3C-N的结合能BE。注氮后N- sp3c和N- sp2c的BE附近也出现了N (1s)谱峰。在2 Pa气压下,膜的N/C比为0.35。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Production of nitrogen-containing carbon plasma using shunting arc discharge for carbon nitride films preparation
Summary form only given. Plasma-based ion implantation and deposition (PBII&D) technology is a promising method for improving surface properties of three-dimensional substrates as a workpiece without a complicated manipulation system. A shunting arc is a convenient pulsed plasma source of metals and semi-metals. In this study, a carbon-shunting arc discharge is generated in nitrogen gas circumstance and amorphous carbon nitride (a-CNx) films are prepared using the plasma. In the experiment, a self-magnetically accelerating system is employed to improve deposition rate. A carbon rod with a diameter of 2 mm and a length of 40 mm is held vertically between a pair of carbon electrodes. A 20 muF-capacitor bank is used to ignite a shunting arc. The carbon film is prepared on a disk target with 80 mm-diameter and 10 mm-thickness is positioned at 100 mm from the rod as an arc source. Silicon substrates are pasted on the disk target and a series of pulse voltage is applied to Si substrate synchronizing with ignition of the shunting arc with a peak current of 1.7 kA. The ambient nitrogen gas pressure is varied from 2times10-2 to 300 Pa. The shunting arc plasma is successfully produced and is accelerated along carbon rails. The heating energy to generate the shunting arc has minimum value for variation of the gas pressure. A spectroscopic measurement of the plasma shows that the produced plasma contains nitrogen particles in ambient nitrogen gas circumstance. X-ray photoelectron spectroscopy analysis shows that the energy at which the C (1s) peak shifts from the binding energy (BE) of C-C to that of sp2C-N and sp3C-N by injecting nitrogen gas. The peak in the N (1s) spectrum also appears around BE of N-sp3C and N-sp2C with the nitrogen injection. The N/C ratio of the film is obtained to be 0.35 at 2 Pa gas pressure.
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