不同热膨胀材料间大面积粘接接头的热疲劳模型

A. Bjorneklett, T. Tuhus, H. Kristiansen
{"title":"不同热膨胀材料间大面积粘接接头的热疲劳模型","authors":"A. Bjorneklett, T. Tuhus, H. Kristiansen","doi":"10.1109/STHERM.1994.288983","DOIUrl":null,"url":null,"abstract":"A model describing thermal fatigue of large area adhesive joints such as die bonds, has been developed. It is based on equations for crack growth rate and stress distribution in large area joints. The basic assumption of the model is that cracks grow from the edges of the area towards the center. The thermal resistance of the bond layer was calculated by assuming the cracked part of the layer had infinite thermal resistance. The thermal resistance as a function of the number of thermal cycles was predicted to be different for adhesives with low and high modulus of elasticity. Good agreement with previously reported experiments was obtained. The thermal resistance in silver filled die bond adhesives as a function of the number of thermal cycles was measured in these experiments.<<ETX>>","PeriodicalId":107140,"journal":{"name":"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A model for thermal fatigue of large area adhesive joints between materials with dissimilar thermal expansion\",\"authors\":\"A. Bjorneklett, T. Tuhus, H. Kristiansen\",\"doi\":\"10.1109/STHERM.1994.288983\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A model describing thermal fatigue of large area adhesive joints such as die bonds, has been developed. It is based on equations for crack growth rate and stress distribution in large area joints. The basic assumption of the model is that cracks grow from the edges of the area towards the center. The thermal resistance of the bond layer was calculated by assuming the cracked part of the layer had infinite thermal resistance. The thermal resistance as a function of the number of thermal cycles was predicted to be different for adhesives with low and high modulus of elasticity. Good agreement with previously reported experiments was obtained. The thermal resistance in silver filled die bond adhesives as a function of the number of thermal cycles was measured in these experiments.<<ETX>>\",\"PeriodicalId\":107140,\"journal\":{\"name\":\"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.1994.288983\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1994.288983","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

建立了大面积粘接(如模具粘接)的热疲劳模型。该方法基于大面积节理裂纹扩展速率和应力分布方程。该模型的基本假设是裂纹从区域边缘向中心扩展。假设粘结层开裂部分的热阻为无限大,计算了粘结层的热阻。预测低弹性模量和高弹性模量胶粘剂的热阻随热循环次数的变化是不同的。与先前报道的实验结果吻合较好。在这些实验中,测量了银填充模粘合胶粘剂的热阻与热循环次数的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A model for thermal fatigue of large area adhesive joints between materials with dissimilar thermal expansion
A model describing thermal fatigue of large area adhesive joints such as die bonds, has been developed. It is based on equations for crack growth rate and stress distribution in large area joints. The basic assumption of the model is that cracks grow from the edges of the area towards the center. The thermal resistance of the bond layer was calculated by assuming the cracked part of the layer had infinite thermal resistance. The thermal resistance as a function of the number of thermal cycles was predicted to be different for adhesives with low and high modulus of elasticity. Good agreement with previously reported experiments was obtained. The thermal resistance in silver filled die bond adhesives as a function of the number of thermal cycles was measured in these experiments.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信