基于微波电路稳定性分析的极零识别灵敏度提高

2008 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits Pub Date : 2008-11-01 DOI:10.1109/INMMIC.2008.4745719

N. Ayllon, A. Anakabe, J. Collantes, G. Soubercaze-Pun, S. Forestier

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引用次数: 16

摘要

在这项工作中，为了提高基于稳定性分析的极零识别的灵敏度，提出了使用双电流-电压(I-V)探头。该方法的优点体现在x波段多级MMIC功率放大器的参数振荡和采用混合微带技术的中功率场效应管放大器的偏置振荡中。

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Sensitivity enhancement in pole-zero identification based stability analysis of microwave circuits

In this work the use of a dual Current-Voltage (I-V) probe is proposed in order to improve the sensitivity of pole-zero identification based stability analyses. The benefits of this approach are shown here by its application to a parametric oscillation in an X-band multi-stage MMIC power amplifier and to a bias oscillation in a medium power FET amplifier built in hybrid microstrip technology.

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来源期刊

2008 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits

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