硅基谐振隧道器件中单带模型的定量评价

T. Sandu
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引用次数: 0

摘要

我们分析了硅基谐振隧道器件(RTD)中单带模型的充分性,而不是多带模型,由于硅是间接带隙半导体,多带模型更接近实际系统。我们基于非平衡格林函数形式的计算表明,在Si中隧穿光电子的单带模型在定量上是合理的,可以模拟基于Si的RTD。发现光电子不仅通过二维态的横向密度,而且还通过势垒的透明度做出贡献。因此,单波段模型可以安全地用于应用中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quantitative assessment of the single-band model in the silicon based resonant tunneling devices
We analyse the adequacy of the single-band model in Si based resonant tunneling devices (RTD's) as opposed to a multi-band model which is closer to real systems due to the fact that Si is an indirect bandgap semiconductor. Our calculations based on non-equilibrium Green function formalism show that a single band model with tunneling light electrons in Si is quantitatively sound in simulating Si based RTD's. It is found that light electrons contribute not only through 2-dimensional (2D) transverse density of states but also through the transparency of the barriers. Thus a single-band model can be safely used in applications.
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