OFDM同步的真实辐射和PVTA故障仿真

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328670

K. Niederkleine, Theodor Hillebrand, S. Paul

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引用次数: 0

摘要

辐射环境下的半导体设计通常采用最坏情况估计来计算可靠运行的需求。在这个过程中，模拟任何任务组件的能力是一个优势，有助于节省成本。

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Realistic Radiation and PVTA fault simulation for OFDM synchronization

Semiconductor design for radiation environments usualy applies worst-case estimations to calculate the needs for reliable operation. The ability to simulate components for any mission is an advantage in this process and helps to save costs.

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来源期刊

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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