循环经济应用中多回流过程中记忆体BGA元件的耐温性研究

J. Sitek, M. Kościelski, Piotr Dawidowicz, Piotr Ciszewski, Mariia Khramova, Duc Nguyen Quang, Sergio Martinez
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引用次数: 2

摘要

本文介绍了在循环经济应用中BGA组件的拆焊和再制造过程中,不同的多回流工艺对记忆BGA组件的耐温性的研究结果。设计了特殊测试PCBA,用于验证存储器和控制器等有源元件的耐温性。从1到12个循环的热暴露(回流过程)已被用于对BGA组件进行彻底的评估。检查每个热过程后组件的功能。“sustainablySMART”项目合作伙伴Blancco科技集团(以下简称“Blancco”)在组件拆焊和再制造后进行了额外的验证。内存测试结果表明,有效元件的耐温性比制造商提供的数据表中所述的要高得多。最常见的缺陷是与PCB焊盘的损坏有关,而不是与有效元件的结构有关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigations of temperature resistance of memory BGA components during multi-reflow processes for Circular Economy applications
This article presents the results of research aimed to evaluate temperature resistance of memory BGA components during different multi-reflow processes which are needed for desoldering and remanufacturing processes of BGA components in Circular Economy applications. Special test PCBA has been designed to verify temperature resistance of active components such as memories and controllers. From 1 to 12 cycles of thermal exposures (reflow processes) have been applied to conduct thorough assessment of BGA components. The functionality of components after each thermal process has been checked right away. Additional verification after desoldering and remanufacturing of components has been performed by “sustainablySMART” project partner — Blancco Technology Group (herein after referred as to “Blancco”). The memory test results show that active components are much more temperature resistant than what is stated in the datasheets provided by the manufacturer. The most frequently observed defects were related to the damage of PCB's pads not to the structure of active components.
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