脉冲宽度控制PLL/DLL使用软温度计代码

T. Nakura, K. Asada
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引用次数: 2

摘要

本文演示了脉冲宽度控制锁相环和DLL使用软温度计代码。锁相环的振荡频率控制和动态锁相环的延迟控制都是由一个1位模拟码进行的。我们的PLL/DLL都不使用面积消耗电容器,导致小硅面积实现。65nm CMOS工艺仅使用120μm×30μm面积用于PLL+DLL。他们实现了2.80GHz的工作,消耗1.35mW/4.65mW, PLL/DLL输出信号的有效值抖动为1.60ps/1.78ps。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pulse width controlled PLL/DLL using soft thermometer code
This paper demonstrates pulse width controlled PLL and DLL using a soft thermometer code. The oscillation frequency control in the PLL and the delay control in the DLL are conducted by a mostly digital with one bit analog code. Both of our PLL/DLL do not use an area-consuming capacitor, resulting in small silicon area implementation. A 65nm CMOS process uses only 120μm×30μm area for the PLL+DLL. They realized 2.80GHz operation consuming 1.35mW/4.65mW with 1.60ps/1.78ps rms jitter from the PLL/DLL output signals.
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