电阻抗计算机断层扫描-算法和应用

Z. Mu, A. Wexler
{"title":"电阻抗计算机断层扫描-算法和应用","authors":"Z. Mu, A. Wexler","doi":"10.1109/NSSMIC.1993.701850","DOIUrl":null,"url":null,"abstract":"The reasons for the low resolution of the Electrical Impedance Computed Tomography(E1CT) algorithms have not been fully explored. Previous investigations focused on the dis- cussions of numerical features of an algorithm. This paper dis- cussed such problems by implementing Point-Accumulative Point-Iterative algorithms to multi-port resistive networks ac- cording to the similarities of the Finite Element method and lin- ear network analysis. The results indicate that improper mea- surement pattems in EICT can cause an EICT algorithm's failure although the number of independent measurements are still higher than the number of unknowns. With the help of graph theory, it is shown that the image quality of EICT is not only dependent on the numerical features of an EICT system, but also on its topological structure. An optimal excitationl measurement pattem algorithm in topological sense is then pro- posed. Successful simulations in the twociimensional field problems are performed. Suggestions to the three-dimensional applications of EICT are made based on the results from the multi-port resistive network recovery.","PeriodicalId":287813,"journal":{"name":"1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Electrical Impedance Computed Tomography -algorithms And Applications\",\"authors\":\"Z. Mu, A. Wexler\",\"doi\":\"10.1109/NSSMIC.1993.701850\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reasons for the low resolution of the Electrical Impedance Computed Tomography(E1CT) algorithms have not been fully explored. Previous investigations focused on the dis- cussions of numerical features of an algorithm. This paper dis- cussed such problems by implementing Point-Accumulative Point-Iterative algorithms to multi-port resistive networks ac- cording to the similarities of the Finite Element method and lin- ear network analysis. The results indicate that improper mea- surement pattems in EICT can cause an EICT algorithm's failure although the number of independent measurements are still higher than the number of unknowns. With the help of graph theory, it is shown that the image quality of EICT is not only dependent on the numerical features of an EICT system, but also on its topological structure. An optimal excitationl measurement pattem algorithm in topological sense is then pro- posed. Successful simulations in the twociimensional field problems are performed. Suggestions to the three-dimensional applications of EICT are made based on the results from the multi-port resistive network recovery.\",\"PeriodicalId\":287813,\"journal\":{\"name\":\"1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.1993.701850\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.1993.701850","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

电阻抗计算机断层扫描(E1CT)算法分辨率低的原因尚未得到充分的探讨。以前的研究主要集中在讨论算法的数值特征。本文根据有限元法与线性网络分析的相似性,将点累加点迭代算法应用于多端口电阻网络中,对这类问题进行了讨论。结果表明,尽管独立测量的数量仍然大于未知的数量,但EICT中不适当的测量模式会导致EICT算法失效。利用图论的方法,证明了EICT的图像质量不仅与系统的数值特征有关,还与系统的拓扑结构有关。在此基础上,提出了一种拓扑意义上的最优激励测量模式算法。对二维场问题进行了成功的模拟。根据多端口电阻网络恢复的结果,对EICT的三维应用提出了建议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electrical Impedance Computed Tomography -algorithms And Applications
The reasons for the low resolution of the Electrical Impedance Computed Tomography(E1CT) algorithms have not been fully explored. Previous investigations focused on the dis- cussions of numerical features of an algorithm. This paper dis- cussed such problems by implementing Point-Accumulative Point-Iterative algorithms to multi-port resistive networks ac- cording to the similarities of the Finite Element method and lin- ear network analysis. The results indicate that improper mea- surement pattems in EICT can cause an EICT algorithm's failure although the number of independent measurements are still higher than the number of unknowns. With the help of graph theory, it is shown that the image quality of EICT is not only dependent on the numerical features of an EICT system, but also on its topological structure. An optimal excitationl measurement pattem algorithm in topological sense is then pro- posed. Successful simulations in the twociimensional field problems are performed. Suggestions to the three-dimensional applications of EICT are made based on the results from the multi-port resistive network recovery.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信