层状金属-介电结构中的负相移:理论与实验

2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS) Pub Date : 2015-12-03 DOI:10.1109/METAMATERIALS.2015.7342597

A. Agashkov, V. Belyi, M. Binhussain, N. Kazak, V. Agabekov, N. Khilo

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引用次数: 0

摘要

利用改进的可移干涉仪测量了Ag/TiO2和Ag/SiO2双层膜的负光学相移。实验揭示了p偏振和s偏振相移各向异性随入射角的增加而单调上升的现象。测量结果与理论计算结果相当吻合。

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Negative phase shift in a layered metal-dielectric structure: Theory and experiment

Measurements of the negative optical phase shifts of Ag/TiO2 and Ag/SiO2 bilayer films have been carried out with the modified walk-off interferometer. Appearance and monotonic rise of the phase shift anisotropy for p- and s-polarization by increasing incidence angle has been revealed experimentally. The results of measurements have shown rather good coincidence with theoretical calculations.

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2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS)

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