管理可变性以实现最终的能源效率

B. Nikolić
{"title":"管理可变性以实现最终的能源效率","authors":"B. Nikolić","doi":"10.1109/ECCTD.2011.6043297","DOIUrl":null,"url":null,"abstract":"Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate the choice of technology, architecture, and implementation techniques that trade off performance for power savings. Energy-efficient design is often achieved for designs that are sensitive to technology and design parameters. On the other hand, increased variability in semiconductor process technology and devices requires added margins in the design to guarantee the desired yield. Sources of variability in scaled technologies are reviewed, along with models and methods for their capture in design. Variability is characterized with respect to the distribution of its components, its spatial and temporal characteristics and its impact on specific circuit topologies. Methods of desensitizing the digital logic and SRAM to variability at low supply voltages are demonstrated.","PeriodicalId":126960,"journal":{"name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Managing variability for ultimate energy efficiency\",\"authors\":\"B. Nikolić\",\"doi\":\"10.1109/ECCTD.2011.6043297\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate the choice of technology, architecture, and implementation techniques that trade off performance for power savings. Energy-efficient design is often achieved for designs that are sensitive to technology and design parameters. On the other hand, increased variability in semiconductor process technology and devices requires added margins in the design to guarantee the desired yield. Sources of variability in scaled technologies are reviewed, along with models and methods for their capture in design. Variability is characterized with respect to the distribution of its components, its spatial and temporal characteristics and its impact on specific circuit topologies. Methods of desensitizing the digital logic and SRAM to variability at low supply voltages are demonstrated.\",\"PeriodicalId\":126960,\"journal\":{\"name\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2011.6043297\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2011.6043297","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

技术规模化是在芯片性能受功耗制约的时代。尽管功率限制因应用程序领域而异,但它们决定了在性能和功耗之间进行权衡的技术、体系结构和实现技术的选择。节能设计通常是对技术和设计参数敏感的设计。另一方面,半导体工艺技术和器件的可变性增加,需要在设计中增加裕度,以保证所需的良率。回顾了规模化技术中可变性的来源,以及在设计中捕获可变性的模型和方法。变异性的特征是相对于其组件的分布,其空间和时间特征及其对特定电路拓扑结构的影响。演示了在低电源电压下对数字逻辑和SRAM的变异性进行脱敏的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Managing variability for ultimate energy efficiency
Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate the choice of technology, architecture, and implementation techniques that trade off performance for power savings. Energy-efficient design is often achieved for designs that are sensitive to technology and design parameters. On the other hand, increased variability in semiconductor process technology and devices requires added margins in the design to guarantee the desired yield. Sources of variability in scaled technologies are reviewed, along with models and methods for their capture in design. Variability is characterized with respect to the distribution of its components, its spatial and temporal characteristics and its impact on specific circuit topologies. Methods of desensitizing the digital logic and SRAM to variability at low supply voltages are demonstrated.
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