用层析成像技术分析材料中的夹杂物

2015 IEEE 13th International Symposium on Applied Machine Intelligence and Informatics (SAMI) Pub Date : 2015-03-19 DOI:10.1109/SAMI.2015.7061847

D. Glittova, T. Tóth, J. Živčák

{"title":"用层析成像技术分析材料中的夹杂物","authors":"D. Glittova, T. Tóth, J. Živčák","doi":"10.1109/SAMI.2015.7061847","DOIUrl":null,"url":null,"abstract":"The aim of this work is to analyze inclusions of samples from selected materials using metrotomography. The main part of the problem was correct methodology of software processing of the measured data acquired by computed tomography equipment Carl Zeiss METROTOM1500. For various settings of the input parameters was investigated expected output data to a known set of defects. Comparison of the effects of setting on results of the assessment should help in setting parameters for evaluation of defects in industrial applications.","PeriodicalId":276598,"journal":{"name":"2015 IEEE 13th International Symposium on Applied Machine Intelligence and Informatics (SAMI)","volume":"16 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Analysis of inclusions at materials by metrotomography\",\"authors\":\"D. Glittova, T. Tóth, J. Živčák\",\"doi\":\"10.1109/SAMI.2015.7061847\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The aim of this work is to analyze inclusions of samples from selected materials using metrotomography. The main part of the problem was correct methodology of software processing of the measured data acquired by computed tomography equipment Carl Zeiss METROTOM1500. For various settings of the input parameters was investigated expected output data to a known set of defects. Comparison of the effects of setting on results of the assessment should help in setting parameters for evaluation of defects in industrial applications.\",\"PeriodicalId\":276598,\"journal\":{\"name\":\"2015 IEEE 13th International Symposium on Applied Machine Intelligence and Informatics (SAMI)\",\"volume\":\"16 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-03-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 13th International Symposium on Applied Machine Intelligence and Informatics (SAMI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SAMI.2015.7061847\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 13th International Symposium on Applied Machine Intelligence and Informatics (SAMI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAMI.2015.7061847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

这项工作的目的是分析从选定的材料样品的包涵体使用地铁断层扫描。该问题的主要部分是蔡司METROTOM1500计算机断层扫描设备采集的测量数据的软件处理方法的正确性。对于各种设置的输入参数进行了调查，预期输出数据为已知缺陷集。比较设置对评估结果的影响应该有助于为工业应用中的缺陷评估设置参数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Analysis of inclusions at materials by metrotomography

The aim of this work is to analyze inclusions of samples from selected materials using metrotomography. The main part of the problem was correct methodology of software processing of the measured data acquired by computed tomography equipment Carl Zeiss METROTOM1500. For various settings of the input parameters was investigated expected output data to a known set of defects. Comparison of the effects of setting on results of the assessment should help in setting parameters for evaluation of defects in industrial applications.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2015 IEEE 13th International Symposium on Applied Machine Intelligence and Informatics (SAMI)

自引率

0.00%

发文量