物联网处理器上屏蔽软件对策的实际评估

D. McCann, E. Oswald
{"title":"物联网处理器上屏蔽软件对策的实际评估","authors":"D. McCann, E. Oswald","doi":"10.1109/IVSW.2017.8031536","DOIUrl":null,"url":null,"abstract":"Implementing cryptography on Internet-of-Things (IoT) devices, that is resilient against side channel analysis, has so far been a task only suitable for specialist software designers in interaction with access to a sophisticated testing facility. Recently a novel tool has been developed, ELMO, which offers the potential to enable non-specialist software developers to evaluate their code w.r.t. power analysis for a popular IoT processor. We explain a crucial extension of ELMO, which enables a user to test higher-order masking schemes much more efficiently than so far possible as well as improve the ease and speed of diagnosing masking errors.","PeriodicalId":184196,"journal":{"name":"2017 IEEE 2nd International Verification and Security Workshop (IVSW)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Practical evaluation of masking software countermeasures on an IoT processor\",\"authors\":\"D. McCann, E. Oswald\",\"doi\":\"10.1109/IVSW.2017.8031536\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Implementing cryptography on Internet-of-Things (IoT) devices, that is resilient against side channel analysis, has so far been a task only suitable for specialist software designers in interaction with access to a sophisticated testing facility. Recently a novel tool has been developed, ELMO, which offers the potential to enable non-specialist software developers to evaluate their code w.r.t. power analysis for a popular IoT processor. We explain a crucial extension of ELMO, which enables a user to test higher-order masking schemes much more efficiently than so far possible as well as improve the ease and speed of diagnosing masking errors.\",\"PeriodicalId\":184196,\"journal\":{\"name\":\"2017 IEEE 2nd International Verification and Security Workshop (IVSW)\",\"volume\":\"99 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 2nd International Verification and Security Workshop (IVSW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVSW.2017.8031536\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 2nd International Verification and Security Workshop (IVSW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVSW.2017.8031536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

到目前为止,在物联网(IoT)设备上实现加密技术是一项只适合专业软件设计人员与复杂测试设施进行交互的任务,它可以抵御侧信道分析。最近开发了一种新的工具ELMO,它提供了使非专业软件开发人员能够评估其代码的潜力,而不是对流行的物联网处理器进行功耗分析。我们解释了ELMO的一个重要扩展,它使用户能够比目前更有效地测试高阶屏蔽方案,并提高了诊断屏蔽错误的便利性和速度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Practical evaluation of masking software countermeasures on an IoT processor
Implementing cryptography on Internet-of-Things (IoT) devices, that is resilient against side channel analysis, has so far been a task only suitable for specialist software designers in interaction with access to a sophisticated testing facility. Recently a novel tool has been developed, ELMO, which offers the potential to enable non-specialist software developers to evaluate their code w.r.t. power analysis for a popular IoT processor. We explain a crucial extension of ELMO, which enables a user to test higher-order masking schemes much more efficiently than so far possible as well as improve the ease and speed of diagnosing masking errors.
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