{"title":"用于850mhz覆盖评估的低成本处理器控制射频场强测量系统","authors":"P. D. O'Kelly, I. Scales, J. Sin","doi":"10.1109/VTC.1982.1623010","DOIUrl":null,"url":null,"abstract":"This paper describes an automated 850 MHz field test instrumentation system. The system, based on an Apple II Plus processor, was designed to gather detailed statistical RF coverage information as well as to act as a general-purpose radio coverage test tool. The constraints behind the selection of an APPLE II Plus processor are outlined. Details are also given of the software design approach and experience with the instrumentation in the field.","PeriodicalId":230854,"journal":{"name":"32nd IEEE Vehicular Technology Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low cost processor-controlled RF field strength measurement system for 850 MHz coverage evaluation\",\"authors\":\"P. D. O'Kelly, I. Scales, J. Sin\",\"doi\":\"10.1109/VTC.1982.1623010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an automated 850 MHz field test instrumentation system. The system, based on an Apple II Plus processor, was designed to gather detailed statistical RF coverage information as well as to act as a general-purpose radio coverage test tool. The constraints behind the selection of an APPLE II Plus processor are outlined. Details are also given of the software design approach and experience with the instrumentation in the field.\",\"PeriodicalId\":230854,\"journal\":{\"name\":\"32nd IEEE Vehicular Technology Conference\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"32nd IEEE Vehicular Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTC.1982.1623010\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"32nd IEEE Vehicular Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTC.1982.1623010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文介绍了一种850mhz自动化现场测试仪器系统。该系统基于Apple II Plus处理器,旨在收集详细的统计射频覆盖信息,并作为通用的无线电覆盖测试工具。本文概述了选择APPLE II Plus处理器背后的限制。还详细介绍了软件设计方法和现场使用仪器的经验。
Low cost processor-controlled RF field strength measurement system for 850 MHz coverage evaluation
This paper describes an automated 850 MHz field test instrumentation system. The system, based on an Apple II Plus processor, was designed to gather detailed statistical RF coverage information as well as to act as a general-purpose radio coverage test tool. The constraints behind the selection of an APPLE II Plus processor are outlined. Details are also given of the software design approach and experience with the instrumentation in the field.