{"title":"部分扫描合成最小长度同步序列的有限状态机","authors":"N. Jiang, Richard M. Chou, K. Saluja","doi":"10.1109/FTCS.1995.466980","DOIUrl":null,"url":null,"abstract":"The goal is to synthesize an FSM with the objective to minimize the number of scanned flip-flops while requiring a minimum number of system clocks to reach the synchronizable state. An algorithm for selecting state variables for scanning while minimizing the length of the synchronizing sequence based on the reverse-order-search technique is presented. Extra transitions may be required to avoid possible lock-in conditions if the initial state is an invalid state for the machines where the number of states is not a power of 2. Experimental results show that the proposed method guarantees synchronizability and testability through the proper state assignment with reasonable hardware overhead for the benchmark circuits.<<ETX>>","PeriodicalId":309075,"journal":{"name":"Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"157 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Synthesizing finite state machines for minimum length synchronizing sequence using partial scan\",\"authors\":\"N. Jiang, Richard M. Chou, K. Saluja\",\"doi\":\"10.1109/FTCS.1995.466980\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The goal is to synthesize an FSM with the objective to minimize the number of scanned flip-flops while requiring a minimum number of system clocks to reach the synchronizable state. An algorithm for selecting state variables for scanning while minimizing the length of the synchronizing sequence based on the reverse-order-search technique is presented. Extra transitions may be required to avoid possible lock-in conditions if the initial state is an invalid state for the machines where the number of states is not a power of 2. Experimental results show that the proposed method guarantees synchronizability and testability through the proper state assignment with reasonable hardware overhead for the benchmark circuits.<<ETX>>\",\"PeriodicalId\":309075,\"journal\":{\"name\":\"Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"volume\":\"157 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1995.466980\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1995.466980","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Synthesizing finite state machines for minimum length synchronizing sequence using partial scan
The goal is to synthesize an FSM with the objective to minimize the number of scanned flip-flops while requiring a minimum number of system clocks to reach the synchronizable state. An algorithm for selecting state variables for scanning while minimizing the length of the synchronizing sequence based on the reverse-order-search technique is presented. Extra transitions may be required to avoid possible lock-in conditions if the initial state is an invalid state for the machines where the number of states is not a power of 2. Experimental results show that the proposed method guarantees synchronizability and testability through the proper state assignment with reasonable hardware overhead for the benchmark circuits.<>