Seungjin Lee, Jonghoon J. Kim, Jinseong Yun, Hee-Jea Cho, Youngho Lee, Kyoungsun Kim, Sungjoon Park, Jeonghyeon Cho, H. Song
{"title":"双路直列内存模块(DIMM)低通滤波器(LPF)使用过孔存根增强信号完整性","authors":"Seungjin Lee, Jonghoon J. Kim, Jinseong Yun, Hee-Jea Cho, Youngho Lee, Kyoungsun Kim, Sungjoon Park, Jeonghyeon Cho, H. Song","doi":"10.1109/EPEPS53828.2022.9947177","DOIUrl":null,"url":null,"abstract":"A novel on-dual in-line memory module (on-DIMM) low-pass filter (LPF) using via stubs is proposed to enhance signal integrity. Proposed on-DIMM LPF implemented with existing via stubs not only eliminates the via stub effects, but also enhances the signal quality due to its low-pass characteristics without additional manufacturing processes and costs. For verification, both time- and frequency-domain simulation results of proposed DQ signal line with on-DIMM LPF are shown and compared with conventional DQ signal line. Proposed on-DIMM LPF exhibits 0.67 dB improvements at 2.8 GHz (nyquist frequency of 5.6 Gbps) shows relatively flat and improved insertion loss. Simulated eye height is improved for 29 mV and 20 mV and eye width is improved for 4.2 ps (0.02 UI) and 3.6 ps (0.02 UI) respectively at 4.8 Gbps and 5.6 Gbps. Finally, measurements verification with test board of on-DIMM LPF is also conducted and shows improvements in insertion loss and eye diagram","PeriodicalId":284818,"journal":{"name":"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On-Dual In-line Memory Module (DIMM) Low-Pass Filter (LPF) using Via Stubs for Enhancing Signal Integrity\",\"authors\":\"Seungjin Lee, Jonghoon J. Kim, Jinseong Yun, Hee-Jea Cho, Youngho Lee, Kyoungsun Kim, Sungjoon Park, Jeonghyeon Cho, H. Song\",\"doi\":\"10.1109/EPEPS53828.2022.9947177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel on-dual in-line memory module (on-DIMM) low-pass filter (LPF) using via stubs is proposed to enhance signal integrity. Proposed on-DIMM LPF implemented with existing via stubs not only eliminates the via stub effects, but also enhances the signal quality due to its low-pass characteristics without additional manufacturing processes and costs. For verification, both time- and frequency-domain simulation results of proposed DQ signal line with on-DIMM LPF are shown and compared with conventional DQ signal line. Proposed on-DIMM LPF exhibits 0.67 dB improvements at 2.8 GHz (nyquist frequency of 5.6 Gbps) shows relatively flat and improved insertion loss. Simulated eye height is improved for 29 mV and 20 mV and eye width is improved for 4.2 ps (0.02 UI) and 3.6 ps (0.02 UI) respectively at 4.8 Gbps and 5.6 Gbps. Finally, measurements verification with test board of on-DIMM LPF is also conducted and shows improvements in insertion loss and eye diagram\",\"PeriodicalId\":284818,\"journal\":{\"name\":\"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"146 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS53828.2022.9947177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS53828.2022.9947177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-Dual In-line Memory Module (DIMM) Low-Pass Filter (LPF) using Via Stubs for Enhancing Signal Integrity
A novel on-dual in-line memory module (on-DIMM) low-pass filter (LPF) using via stubs is proposed to enhance signal integrity. Proposed on-DIMM LPF implemented with existing via stubs not only eliminates the via stub effects, but also enhances the signal quality due to its low-pass characteristics without additional manufacturing processes and costs. For verification, both time- and frequency-domain simulation results of proposed DQ signal line with on-DIMM LPF are shown and compared with conventional DQ signal line. Proposed on-DIMM LPF exhibits 0.67 dB improvements at 2.8 GHz (nyquist frequency of 5.6 Gbps) shows relatively flat and improved insertion loss. Simulated eye height is improved for 29 mV and 20 mV and eye width is improved for 4.2 ps (0.02 UI) and 3.6 ps (0.02 UI) respectively at 4.8 Gbps and 5.6 Gbps. Finally, measurements verification with test board of on-DIMM LPF is also conducted and shows improvements in insertion loss and eye diagram