{"title":"基于新型六端口技术的高速VSWR测试","authors":"P. Goodman","doi":"10.1109/ARFTG.1982.323527","DOIUrl":null,"url":null,"abstract":"This paper describes a method of using a six-port network for rapid testing of low reflection components in a production environment. The six-port network used is the conventional correlator circuit with two directional couplers and with back diode detectors as power sensors. The detector outputs are measured, corrected, and displayed by a waveform processing oscilloscope. The technique is extremely fast, accurate, and easy to use for low VSWR measurements.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High Speed VSWR Testing with a Novel Six-Port Technique\",\"authors\":\"P. Goodman\",\"doi\":\"10.1109/ARFTG.1982.323527\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a method of using a six-port network for rapid testing of low reflection components in a production environment. The six-port network used is the conventional correlator circuit with two directional couplers and with back diode detectors as power sensors. The detector outputs are measured, corrected, and displayed by a waveform processing oscilloscope. The technique is extremely fast, accurate, and easy to use for low VSWR measurements.\",\"PeriodicalId\":101950,\"journal\":{\"name\":\"20th ARFTG Conference Digest\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"20th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1982.323527\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"20th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1982.323527","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High Speed VSWR Testing with a Novel Six-Port Technique
This paper describes a method of using a six-port network for rapid testing of low reflection components in a production environment. The six-port network used is the conventional correlator circuit with two directional couplers and with back diode detectors as power sensors. The detector outputs are measured, corrected, and displayed by a waveform processing oscilloscope. The technique is extremely fast, accurate, and easy to use for low VSWR measurements.