各种旁路开关及其在光伏阵列上减热点应用的综合研究

A. Verma, Diwaker Pathak, P. Gaur
{"title":"各种旁路开关及其在光伏阵列上减热点应用的综合研究","authors":"A. Verma, Diwaker Pathak, P. Gaur","doi":"10.1109/ICIERA53202.2021.9726757","DOIUrl":null,"url":null,"abstract":"The paper shows a comprehensive study of various bypass topologies to mitigate hotspot problem due to partial shading conditions, cracking of solar modules, de-soldering of PV cells, etc. The hot spot created in solar cells are a result of high charge accumulation rate which reflects as counter leakage current. To reduce the severity of hot spot different topologies utilizing bypass diode, overlapped bypass diode, switches like MOSFET, IGBT, etc. are studied which are employed to mitigate the hotspot problem.","PeriodicalId":220461,"journal":{"name":"2021 International Conference on Industrial Electronics Research and Applications (ICIERA)","volume":"177 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Comprehensive Study of Various Bypass Switches and Their Applications on PV Array for Hotspot Reduction\",\"authors\":\"A. Verma, Diwaker Pathak, P. Gaur\",\"doi\":\"10.1109/ICIERA53202.2021.9726757\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper shows a comprehensive study of various bypass topologies to mitigate hotspot problem due to partial shading conditions, cracking of solar modules, de-soldering of PV cells, etc. The hot spot created in solar cells are a result of high charge accumulation rate which reflects as counter leakage current. To reduce the severity of hot spot different topologies utilizing bypass diode, overlapped bypass diode, switches like MOSFET, IGBT, etc. are studied which are employed to mitigate the hotspot problem.\",\"PeriodicalId\":220461,\"journal\":{\"name\":\"2021 International Conference on Industrial Electronics Research and Applications (ICIERA)\",\"volume\":\"177 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 International Conference on Industrial Electronics Research and Applications (ICIERA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIERA53202.2021.9726757\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on Industrial Electronics Research and Applications (ICIERA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIERA53202.2021.9726757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文对各种旁路拓扑进行了全面研究,以缓解由于部分遮阳条件,太阳能组件开裂,光伏电池脱焊等引起的热点问题。在太阳能电池中产生的热点是由于高电荷积累率,反映为反漏电流。为了降低热点问题的严重性,研究了利用旁路二极管、重叠旁路二极管、MOSFET、IGBT等开关的不同拓扑结构来缓解热点问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Comprehensive Study of Various Bypass Switches and Their Applications on PV Array for Hotspot Reduction
The paper shows a comprehensive study of various bypass topologies to mitigate hotspot problem due to partial shading conditions, cracking of solar modules, de-soldering of PV cells, etc. The hot spot created in solar cells are a result of high charge accumulation rate which reflects as counter leakage current. To reduce the severity of hot spot different topologies utilizing bypass diode, overlapped bypass diode, switches like MOSFET, IGBT, etc. are studied which are employed to mitigate the hotspot problem.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信