用多长度TDR数据研究材料的色散规律

R. Persico, I. Farhat, L. Farrugia, C. Sammut
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引用次数: 2

摘要

在这个贡献中,提出了一种基于TDR测量的方法来检索被测材料(MUT)的分散规律。特别是,我们提出了一种多长度方法,用于在多个频率重复的反射模式下进行TDR测量。通过在每个频率使用多长度TDR探头代替多频率测量,可以在感兴趣的频带中检索MUT的复杂等效介电常数。该算法已与商业代码CST Microstudio模拟的数值全波数据进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of the dispersion law of materials by means of multi-length TDR data
In this contribution a method for retrieving the dispersion law of a material under test (MUT) is proposed, based on TDR measurements. In particular, we propose a multilength approach for TDR measurements in reflection mode repeated at several frequencies. By replacing the multi - frequency measurements with measurements using multi-length TDR probe at each frequency, it is possible to retrieve the complex equivalent permittivity of the MUT in a band of interest. The algorithm has been validated vs. numerical full wave data simulated with the commercial code CST Microstudio.
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