超低应力SiO2离子束沉积涂层

E. Randel, A. Davenport, A. Markosyan, R. Bassiri, M. Fejer, C. Menoni
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引用次数: 0

摘要

离子束溅射薄膜通常具有较高的压应力。利用高能一次离子溅射SiO2靶材,利用O2等离子体溅射辅助源的高能离子,可将SiO2的压缩应力显著降低至62MPa。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultra-low Stress SiO2 Ion Beam Deposition Coatings
Ion beam sputtered films typically have high compressive stress. By using high energy primary ions to sputter a SiO2 target and high energy ions from an assist source with an O2 plasma the compressive stress of SiO2 can be significantly reduced down to 62MPa.
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